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"Extracting interconnect capacitance sensitivity to linewidth variation."

Nick Huang, Andrew Labun (2009)

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DOI: 10.1109/CCECE.2009.5090117

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Nick Huang, Andrew Labun:
Extracting interconnect capacitance sensitivity to linewidth variation. CCECE 2009: 185-189

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