"Defect tracking and reliability modeling for a new product release."

Shanker Sanyal et al. (1992)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-30

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  dblp key:
  - conf/cascon/SanyalAGWL92
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  - https://dblp.org/rec/conf/cascon/SanyalAGWL92
Shanker Sanyal, Ken Aida, Kostas Gaitanos, George Wowk, Sam Lahiri:
Defect tracking and reliability modeling for a new product release. CASCON 1992: 409-422

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