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"The impact of the measurement accuracy and the excitation pattern on EIT ..."

Shu Zhao et al. (2013)

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DOI: 10.1109/BMEI.2013.6746907

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Shu Zhao, Juan Deng, Hong Sha, Yan Wang, Chaoshi Ren:
The impact of the measurement accuracy and the excitation pattern on EIT image reconstruction. BMEI 2013: 59-63

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