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"A Deep Learning Based End-to-end Surface Defect Detection Method for ..."

Yuhang Lan, Chaobing Huang (2023)

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DOI: 10.1145/3592686.3592695

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-15

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Yuhang Lan, Chaobing Huang:
A Deep Learning Based End-to-end Surface Defect Detection Method for Industrial Scenes. BIC 2023: 45-49

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