"Electro-Thermal Investigation of SiGe HBTs: A Review."

Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty (2023)

Details and statistics

DOI: 10.1109/BCICTS54660.2023.10310701

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-01

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