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"Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for ..."

Ajay Raman et al. (2021)

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DOI: 10.1109/BCICTS50416.2021.9682457

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-31

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  - conf/bcicts/RamanJVLRNJ21
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Ajay Raman, Vibhor Jain, Elanchezhian Veeramani, Beng Woon Lim, Uppili S. Raghunathan, Yves Ngu, Alvin Joseph:
Analysis of the Factors Limiting the RF Breakdown Voltage in SiGe HBTs for Wi-Fi PA Applications. BCICTS 2021: 1-4

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