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"Improved Defect Detection Using Novel Wavelet Feature Extraction Involving ..."

Dimitris A. Karras, Basil G. Mertzios (2002)

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DOI: 10.1007/3-540-36187-1_56

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-01

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  - conf/ausai/KarrasM02a
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Dimitris A. Karras, Basil G. Mertzios:
Improved Defect Detection Using Novel Wavelet Feature Extraction Involving Principal Component Analysis and Neural Network Techniques. Australian Joint Conference on Artificial Intelligence 2002: 638-647

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