Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on ..."

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu (1998)

> Home

Details and statistics

DOI: 10.1109/ATS.1998.741619

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/YanagidaTT98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/YanagidaTT98
Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu:
Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. Asian Test Symposium 1998: 237-

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.