default search action
"A Thermal-Driven Test Application Scheme for 3-Dimensional ICs."
Dong Xiang, Kele Shen, Yangdong Deng (2012)
- Dong Xiang, Kele Shen, Yangdong Deng:
A Thermal-Driven Test Application Scheme for 3-Dimensional ICs. Asian Test Symposium 2012: 101-106
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.