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"Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for ..."

Michihiro Shintani, Mamoru Ishizaka, Michiko Inoue (2021)

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DOI: 10.1109/ATS52891.2021.00017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Michihiro Shintani, Mamoru Ishizaka, Michiko Inoue:
Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for Memristor Neural Network. ATS 2021: 25-30

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