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"Built-in Self-Test for State Faults Induced by Crosstalk in Sequential ..."

Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita (2001)

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DOI: 10.1109/ATS.2001.990336

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita:
Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits. Asian Test Symposium 2001: 469

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