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"Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test ..."

Rajamani Sethuram et al. (2006)

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DOI: 10.1109/ATS.2006.260953

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell:
Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. ATS 2006: 339-348

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