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"Static Test Compaction for Scan-Based Designs to Reduce Test Application Time."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/ATS.1998.741614

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Sudhakar M. Reddy:
Static Test Compaction for Scan-Based Designs to Reduce Test Application Time. Asian Test Symposium 1998: 198-203

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