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"Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing ..."

Gaku Ogihara et al. (2020)

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DOI: 10.1109/ATS49688.2020.9301550

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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  - https://dblp.org/rec/conf/ats/OgiharaNHSIOIKA20
Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi:
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. ATS 2020: 1-6

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