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"Influence of Device Parameter Variability on Current Sharing of ..."

Yohei Nakamura et al. (2020)

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DOI: 10.1109/ATS49688.2020.9301592

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Yohei Nakamura, Naotaka Kuroda, Atsushi Yamaguchi, Ken Nakahara, Michihiro Shintani, Takashi Sato:
Influence of Device Parameter Variability on Current Sharing of Parallel-Connected SiC MOSFETs. ATS 2020: 1-6

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