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"On Improving Transition Test Set Quality to Detect CMOS Transistor ..."
Xijiang Lin, Wu-Tung Cheng, Janusz Rajski (2015)
- Xijiang Lin, Wu-Tung Cheng, Janusz Rajski:
On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. ATS 2015: 97-102
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