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"Design-for-Test Circuit for the Reduced Code Based Linearity Test Method ..."

Jin-Fu Lin, Soon-Jyh Chang, Chih-Hao Huang (2009)

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DOI: 10.1109/ATS.2009.18

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jin-Fu Lin, Soon-Jyh Chang, Chih-Hao Huang:
Design-for-Test Circuit for the Reduced Code Based Linearity Test Method in Pipelined ADCs with Digital Error Correction Technique. Asian Test Symposium 2009: 57-62

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