"Strong self-testability for data paths high-level synthesis."

Xiaowei Li, Toshimitsu Masuzawa, Hideo Fujiwara (2000)

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DOI: 10.1109/ATS.2000.893630

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xiaowei Li, Toshimitsu Masuzawa, Hideo Fujiwara:
Strong self-testability for data paths high-level synthesis. Asian Test Symposium 2000: 229-234

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