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"Combination Of Automatic Test Pattern Generation And Built-In Intermediate ..."
Kuen-Jong Lee et al. (1996)
- Kuen-Jong Lee, Jing-Jou Tang, Tsung-Chu Huang, Cheng-Liang Tsai:
Combination Of Automatic Test Pattern Generation And Built-In Intermediate Voltage Sensing For Detecting CMOS Bridging Faults. Asian Test Symposium 1996: 100-
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