"On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests."

Nan-Cheng Lai, Sying-Jyan Wang (2008)

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DOI: 10.1109/ATS.2008.46

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nan-Cheng Lai, Sying-Jyan Wang:
On-Chip Test Generation Mechanism for Scan-Based Two-Pattern Tests. ATS 2008: 251-256

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