"BIST testability enhancement using high level test synthesis for ..."

Kowen Lai, Christos A. Papachristou, Mikhail Baklashov (1997)

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DOI: 10.1109/ATS.1997.643980

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kowen Lai, Christos A. Papachristou, Mikhail Baklashov:
BIST testability enhancement using high level test synthesis for behavioral and structural designs. Asian Test Symposium 1997: 338-342

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