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"Test Cost Reduction for Performance Yield Recovery by Classification of ..."

Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou (2012)

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DOI: 10.1109/ATS.2012.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou:
Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data. Asian Test Symposium 2012: 320-325

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