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"On Detection of Resistive Bridging Defects by Low-Temperature and ..."

Sandip Kundu et al. (2005)

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DOI: 10.1109/ATS.2005.83

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker:
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Asian Test Symposium 2005: 266-271

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