Stop the war!
Остановите войну!
for scientists:
default search action
"The Application of BIST-Aided Scan Test for Real Chips."
Hideaki Konishi, Michiaki Emori, Takahisa Hiraide (2006)
- Hideaki Konishi, Michiaki Emori, Takahisa Hiraide:
The Application of BIST-Aided Scan Test for Real Chips. ATS 2006: 131
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.