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"Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to ..."

M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor (1999)

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DOI: 10.1109/ATS.1999.810749

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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M. H. Konijnenburg, Hans van der Linden, Ad J. van de Goor:
Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation. Asian Test Symposium 1999: 185-191

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