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"A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous ..."

Hyunjin Kim, Jacob A. Abraham (2010)

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DOI: 10.1109/ATS.2010.30

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hyunjin Kim, Jacob A. Abraham:
A Low Cost Built-In Self-Test Circuit for High-Speed Source Synchronous Memory Interfaces. Asian Test Symposium 2010: 123-128

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