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"Formal Verification Of Self-Testing Properties Of Combinational Circuits."

Kazuo Kawakubo, Koji Tanaka, Hiromi Hiraishi (1996)

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DOI: 10.1109/ATS.1996.555147

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/KawakuboTH96
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  persistent URL:
  - https://dblp.org/rec/conf/ats/KawakuboTH96
Kazuo Kawakubo, Koji Tanaka, Hiromi Hiraishi:
Formal Verification Of Self-Testing Properties Of Combinational Circuits. Asian Test Symposium 1996: 119-122

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