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"Application of Residue Sampling to RF/AMS Device Testing."

Shogo Katayama et al. (2021)

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DOI: 10.1109/ATS52891.2021.00016

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-17

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  - conf/ats/KatayamaAKAIOK21
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  - https://dblp.org/rec/conf/ats/KatayamaAKAIOK21
Shogo Katayama, Yudai Abe, Anna Kuwana, Koji Asami, Masahiro Ishida, Ryuya Ohta, Haruo Kobayashi:
Application of Residue Sampling to RF/AMS Device Testing. ATS 2021: 19-24

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