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"On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits."

Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko (1999)

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DOI: 10.1109/ATS.1999.810724

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/KajiharaMK99
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  persistent URL:
  - https://dblp.org/rec/conf/ats/KajiharaMK99
Seiji Kajihara, Atsushi Murakami, Tomohisa Kaneko:
On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits. Asian Test Symposium 1999: 20-24

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