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"A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths ..."

Toshinori Hosokawa et al. (2003)

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DOI: 10.1109/ATS.2003.1250797

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshinori Hosokawa, Hiroshi Date, Masahide Miyazaki, Michiaki Muraoka, Hideo Fujiwara:
A Method of Test Plan Grouping to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint. Asian Test Symposium 2003: 130-135

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