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"Automatic Test Pattern Generation for Improving the Fault Coverage of ..."

Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki (1999)

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DOI: 10.1109/ATS.1999.810723

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/ats/HiraseYS99
Junichi Hirase, Shinichi Yoshimura, Tomohisa Sczaki:
Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors. Asian Test Symposium 1999: 13-19

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