"Test Generation for Double Stuck-at Faults."

Yoshinobu Higami, Naoko Takahashi, Yuzo Takamatsu (2001)

Details and statistics

DOI: 10.1109/ATS.2001.990261

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics