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"Test sequence compaction for sequential circuits with reset states."

Yoshinobu Higami, Yuzo Takamatsu, Kozo Kinoshita (2000)

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DOI: 10.1109/ATS.2000.893620

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yoshinobu Higami, Yuzo Takamatsu, Kozo Kinoshita:
Test sequence compaction for sequential circuits with reset states. Asian Test Symposium 2000: 165-170

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