"Test Generation for Transistor Shorts using Stuck-at Fault Simulator and ..."

Yoshinobu Higami et al. (2007)

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DOI: 10.1109/ATS.2007.64

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-09

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Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu:
Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator. ATS 2007: 271-274

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