"Testing for Missing-Gate Faults in Reversible Circuits."

John P. Hayes, Ilia Polian, Bernd Becker (2004)

Details and statistics

DOI: 10.1109/ATS.2004.84

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics