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"A New Test Paradigm for Semiconductor Memories in the Nano-Era."
Said Hamdioui et al. (2011)
- Said Hamdioui, Venkataraman Krishnaswami, Ijeoma Sandra Irobi, Zaid Al-Ars:
A New Test Paradigm for Semiconductor Memories in the Nano-Era. Asian Test Symposium 2011: 347-352
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