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ORCID"A BIST Structure to Test Delay Faults in a Scan Environment."
Patrick Girard et al. (1998)
- Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel:
A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439
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