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"Comparison of Open and Resistive-Open Defect Test Conditions in SRAM ..."
Luigi Dilillo et al. (2003)
- Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel

, Simone Borri:
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255

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