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"A parallel sequential test generation system DESCARTES based on ..."

Hiroshi Date, Michinobu Nakao, Kazumi Hatayama (1995)

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DOI: 10.1109/ATS.1995.485344

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroshi Date, Michinobu Nakao, Kazumi Hatayama:
A parallel sequential test generation system DESCARTES based on real-valued logic simulation. Asian Test Symposium 1995: 252-258

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