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ORCID"A SoC Test Strategy Based on a Non-Scan DFT Method."
Hiroshi Date, Toshinori Hosokawa, Michiaki Muraoka (2002)
- Hiroshi Date, Toshinori Hosokawa, Michiaki Muraoka:
A SoC Test Strategy Based on a Non-Scan DFT Method. Asian Test Symposium 2002: 305-310
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