"Effective parallel processing techniques for the generation of test data ..."

Paul Chang, Brion L. Keller, Sarala Paliwal (2000)

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DOI: 10.1109/ATS.2000.893652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Paul Chang, Brion L. Keller, Sarala Paliwal:
Effective parallel processing techniques for the generation of test data for a logic built-in self test system. Asian Test Symposium 2000: 374-379

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