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"A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool."

Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra (2004)

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DOI: 10.1109/ATS.2004.6

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/BiswasMP04
Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra:
A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool. Asian Test Symposium 2004: 184-189

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