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"Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams ..."

Matthias Beyer, Winfried Dulz, Fenhua Zhen (2003)

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DOI: 10.1109/ATS.2003.1250791

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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Matthias Beyer, Winfried Dulz, Fenhua Zhen:
Automated TTCN-3 Test Case Generation by Means of UML Sequence Diagrams and Markov Chains. Asian Test Symposium 2003: 102-105

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