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"A BIST Solution for the Functional Characterization of RF Systems Based on ..."

Manuel J. Barragan Asian et al. (2009)

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DOI: 10.1109/ATS.2009.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/AsianFVRH09
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  persistent URL:
  - https://dblp.org/rec/conf/ats/AsianFVRH09
Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas:
A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis. Asian Test Symposium 2009: 255-260

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