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ORCID"A cost effective test screening method on 40-nm 4-Mb embedded SRAM for ..."
Yoshisato Yokoyama et al. (2015)
- Yoshisato Yokoyama, Yuichiro Ishii, Toshihiro Inada, Koji Tanaka, Miki Tanaka, Yoshiki Tsujihashi, Koji Nii:
A cost effective test screening method on 40-nm 4-Mb embedded SRAM for low-power MCU. A-SSCC 2015: 1-4
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