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"Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM)."

Hyunui Lee et al. (2016)

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DOI: 10.1109/ASSCC.2016.7844162

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/asscc/LeeKYYJAKKSSPKN16
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  persistent URL:
  - https://dblp.org/rec/conf/asscc/LeeKYYJAKKSSPKN16
Hyunui Lee, Sukyong Kang, Hye-Seung Yu, Won-Joo Yun, Jae-Hun Jung, Sungoh Ahn, Wang-Soo Kim, Beomyong Kil, Yoo-Chang Sung, Sang-Hoon Shin, Yong-Sik Park, Yong-Hwan Kim, Kyung-Woo Nam, Indal Song, Kyomin Sohn, Yong-Cheol Bae, Jung-Hwan Choi, Seong-Jin Jang, Gyo-Young Jin:
Design of non-contact 2Gb/s I/O test methods for high bandwidth memory (HBM). A-SSCC 2016: 169-172

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