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"Fine-grained fault tolerance using device checkpoints."

Asim Kadav, Matthew J. Renzelmann, Michael M. Swift (2013)

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DOI: 10.1145/2451116.2451168

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-07

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  dblp key:
  - conf/asplos/KadavRS13
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  persistent URL:
  - https://dblp.org/rec/conf/asplos/KadavRS13
Asim Kadav, Matthew J. Renzelmann, Michael M. Swift:
Fine-grained fault tolerance using device checkpoints. ASPLOS 2013: 473-484

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