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ORCID"An on-chip characterizing system for within-die delay variation ..."
Xin Zhang et al. (2011)
- Xin Zhang, Koichi Ishida, Makoto Takamiya, Takayasu Sakurai:
An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOS. ASP-DAC 2011: 109-110
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