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"A design- for-diagnosis technique for diagnosing both scan chain faults ..."

Fei Wang et al. (2008)

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DOI: 10.1109/ASPDAC.2008.4484017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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  - https://dblp.org/rec/conf/aspdac/WangHLL08
Fei Wang, Yu Hu, Huawei Li, Xiaowei Li:
A design- for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults. ASP-DAC 2008: 571-576

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