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"Statistical noise margin estimation for sub-threshold combinational circuits."

Yu Pu et al. (2008)

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DOI: 10.1109/ASPDAC.2008.4483935

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
  - conf/aspdac/PuGCH08
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/PuGCH08
Yu Pu, José de Jesus Pineda de Gyvez, Henk Corporaal, Yajun Ha:
Statistical noise margin estimation for sub-threshold combinational circuits. ASP-DAC 2008: 176-179

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